YBCO thin films on multilayers prepared by all-chemical solution deposition processing

Citation
H. Hiei et al., YBCO thin films on multilayers prepared by all-chemical solution deposition processing, PHYSICA C, 357, 2001, pp. 942-945
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
357
Year of publication
2001
Part
2
Pages
942 - 945
Database
ISI
SICI code
0921-4534(200108)357:<942:YTFOMP>2.0.ZU;2-G
Abstract
The chemical solution deposition (CSD) technique has been applied to prepar e both YBa2Cu3O7-delta (YBCO) and buffer layers on a YSZ substrate. Y2O3 an d CeO2 Were employed as the buffer layers, and it was confirmed that they g rew epitaxially by the CSD method. Cross-sectional transmission electron mi croscope observations revealed that Y2O3 grew up to the top of the film. Fu rthermore, the YBCO film on the Y2O3 or CeO2/Y2O3 layers were c-axis aligne d and showed a good in-plane alignment. The transition temperature and the critical current density of the Y-BCO/Y2O3/YSZ multilayer were 89 K and 4 x 10(4) A/cm(2) at 77 K, 0 T, respectively. (C) 2001 Elsevier Science B.V. A ll rights reserved.