This paper presents a large-area pulsed laser deposition system for deposit
ing YBa2Cu3O7-x (YBCO) thin films on substrates ranging from 1 to over 3 in
. in diameter. In this system, the rotating target and the focusing lens ar
e allowed to scan synchronously using a computer-controlled stepper motor i
n order to obtain uniform film properties over the substrate. We propose a
simple method for controlling the compositional and thickness distribution
of the films and demonstrated epitaxial YBCO deposition over a 3 in, diamet
er Si(100) wafer with Y2O3/yttria-stabilized zirconia (YSZ) buffer layers u
sing this new method. (C) 2001 Elsevier Science B.V. All rights reserved.