Nd-Ba-Cu-O sample fabricated by the oxygen-controlled-melt-growth method ex
hibits large J(c) values in a high field region and also shows a secondary
peak effect. In the present study, the Nd-Ba-Cu-O sample was characterized
by using the flux profile technique, in which the chi ' signal is plotted a
gainst the amplitude of AC field. J(c) values determined with the flux prof
ile technique also showed a clear secondary peak effect. In addition, such
J(c) values were higher than those measured with DC susceptibility, presuma
bly due to a difference in the electric field to determine J(c). (C) 2001 P
ublished by Elsevier Science B.V.