Probabilistic properties of wavelets in kinetic surface roughening - art. no. 027104

Using the data of a recent numerical simulation [M. Ahr and M. Biehl, Phys. Rev. E 62, 1773 (2000)] of homoepitaxial growth it is shown that the obser ved probability distribution of a wavelet based measure of the growing surf ace roughness is consistent with a stretched log-normal distribution and th e corresponding branching dimension depends on the level of particle desorp tion.