Formation of conductive CdO layer on CdS thin films during air heating

Citation
Pk. Nair et al., Formation of conductive CdO layer on CdS thin films during air heating, SEMIC SCI T, 16(8), 2001, pp. 651-656
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
16
Issue
8
Year of publication
2001
Pages
651 - 656
Database
ISI
SICI code
0268-1242(200108)16:8<651:FOCCLO>2.0.ZU;2-A
Abstract
A thin layer of CdO is formed on a chemically deposited CdS thin film throu gh reaction with atmospheric oxygen during heating in air for 5-240 min at 370-500 degreesC. The sheet resistance of the film drops from about 10(13) Omega -3.5 k Omega (370 degreesC) and 470 Omega (500 degreesC). From optica l transmittance and reflectance spectra, the thickness of the CdO layer was found to be about 10 nm; the crystalline grain size is 12-25 nm, depending on the temperature and duration of heating, and the estimated electrical r esistivity is 10(-4)-10(-3) Omega cm. The optical bandgap of the CdS-CdO la yer is effectively that of the underlying CdS thin film. about 2.45 eV in t he annealed film. The CdS, which remains under the conductive CdO top layer , is photosensitive, with a photo-to-dark current ratio of 10(3) and crysta lline grain diameter of about 10 nm in the case of a film heated at 500 deg reesC for 5 min. These results are discussed in the context of window layer s in solar cells.