Von Neumann hybrid cellular automata for generating deterministic test sequences

Citation
D. Kagaris et S. Tragoudas, Von Neumann hybrid cellular automata for generating deterministic test sequences, ACM T DES A, 6(3), 2001, pp. 308-321
Citations number
11
Categorie Soggetti
Computer Science & Engineering
Journal title
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
ISSN journal
10844309 → ACNP
Volume
6
Issue
3
Year of publication
2001
Pages
308 - 321
Database
ISI
SICI code
1084-4309(200107)6:3<308:>2.0.ZU;2-#
Abstract
We propose an on-chip test pattern generator that uses an one-dimensional c ellular automaton (CA) to generate either a precomputed sequence of test pa tterns or pairs of test patterns for path delay faults. To our knowledge, t his is the first approach that guarantees successful on-chip generation of a given test pattern sequence (or a given test set for path delay faults) u sing a finite number of CA cells. Given a pair of columns (C-u, C-v) of the test matrix, the proposed method uses alternative "link procedures" P-j th at compute the number of extra CA cells to enable the generation of (C-u, C -v) by the CA. A systematic approach uses the link procedures to minimize t he total number of needed CA cells. The performance of the scheme depends o n an appropriate choice of link procedures P-j.