An accurate statistical yield model for CMOS current-steering D/A converters

Authors
van den Bosch, A Steyaert, M Sansen, W
Citation
A. Van Den Bosch et al., An accurate statistical yield model for CMOS current-steering D/A converters, ANALOG IN C, 29(3), 2001, pp. 173-180
Citations number
7
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
ISSN journal
09251030 → ACNP
Volume
29
Issue
3
Year of publication
2001
Pages
173 - 180
Database
ISI
SICI code
0925-1030(200112)29:3<173:AASYMF>2.0.ZU;2-D
Abstract
To obtain a high resolution CMOS current-steering digital-to-analog convert er, the matching behavior of the current source transistors is one of the k ey issues in the design. At this moment, these matching properties are take n into account by the use of time consuming and CPU intensive Monte Carlo s imulations. In this paper, a formula is derived that describes accurately t he impact of the mismatch on the INL (integral non-linearity) yield of curr ent-steering D/A converters without any loss of design time.