CRYSTAL-GROWTH AND STRUCTURAL CHARACTERIZATION OF NEW PIEZOELECTRIC MATERIAL LA3TA0.5GA5.5O14

Citation
H. Takeda et al., CRYSTAL-GROWTH AND STRUCTURAL CHARACTERIZATION OF NEW PIEZOELECTRIC MATERIAL LA3TA0.5GA5.5O14, JPN J A P 2, 36(7B), 1997, pp. 919-921
Citations number
19
Categorie Soggetti
Physics, Applied
Volume
36
Issue
7B
Year of publication
1997
Pages
919 - 921
Database
ISI
SICI code
Abstract
New piezoelectric La3Ta0.5Ga5.5O14 bulk single crystals were grown usi ng the Czochralski technique. The crystal structure (space group P321, a = 8.228(2), c = 5.124(2) Angstrom) has been refined using single-cr ystal X-ray diffraction data with a precision corresponding to an R in dex of 0.04. Ta atoms were found to be ordered in the octahedral site coordinated by six oxygen atoms.