Surface fluctuation spectroscopy by surface-light-scattering spectroscopy

Citation
Ja. Mann et al., Surface fluctuation spectroscopy by surface-light-scattering spectroscopy, APPL OPTICS, 40(24), 2001, pp. 4092-4112
Citations number
39
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
40
Issue
24
Year of publication
2001
Pages
4092 - 4112
Database
ISI
SICI code
0003-6935(20010820)40:24<4092:SFSBSS>2.0.ZU;2-2
Abstract
In recent years surface-light-scattering spectroscopy has been transformed from a complex optical experiment requiring substantial effort to operate e ffectively to a simpler instrument for which an accurate theory of operatio n has been developed. The accuracy and precision are sufficiently enhanced that refinement of the theory of spectral band shapes is justified to inclu de more subtle effects such as bending moduli and thin-film forces associat ed with the van der Waals and the Casimir effects. We show how to develop e xtensions of the theory of interfacial fluctuations through the mass and th e momentum balances of interfacial transport. We also show that free-energy functionals can be used to express curvature effects crisply. The results are detailed formulas that can be used to fit experimental spectra. (C) 200 1 Optical Society of America.