InAlAs/InGaAs metamorphic high-electron-mobility transistor structures with
different spacer layers on GaAs substrates are characterized by Raman meas
urements. The influence of In0.52Al0.48As spacer thickness on longitudinal
optic phonon-plasmon coupling is investigated. It is found that the intensi
ty of GaAs-like longitudinal optic phonon, which couples with collective in
tersubband transitions of two-dimensional electron gas, is strongly affecte
d by the different subband energy spacings, subband electron concentrations
, and wave function distributions, which are determined by different spacer
thicknesses. (C) 2001 American Institute of Physics.