H. Hobert et al., HE-INDUCED DAMAGE OF SILICON-CARBIDE STUDIED BY VIBRATIONAL SPECTROSCOPY( BEAM), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 129(2), 1997, pp. 244-249
The damaging of 6H-SiC by He+ ions with 700 and 1400 keV and doses bet
ween 0.5 and 24 x 10(14) ions cm(-2) was studied by IR and Raman spect
roscopy. Optical modelling of the IR spectra indicates the formation o
f two layers: a light absorbing surface layer of disturbed crystalline
material with a thickness of 1.6 and 3.1 mu m, respectively, and an i
nterface layer with a thickness of 0.3 mu m and a dose-proportional in
crease of the refractive index. Raman spectra show a special kind of l
attice distortions and decrease of the sharp bands of the crystalline
bulk carbide, which is proportional to the ion dose also and is caused
by the diminished transparency of the surface layers.