Accurate non-uniform transmission line model and its application to the de-embedding of on-wafer measurements

Authors
Young, PR McPherson, DS Chrisostomidis, C Elgaid, K Thayne, IG Lucyszyn, S Robertson, ID
Citation
Pr. Young et al., Accurate non-uniform transmission line model and its application to the de-embedding of on-wafer measurements, IEE P-MIC A, 148(3), 2001, pp. 153-156
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEE PROCEEDINGS-MICROWAVES ANTENNAS AND PROPAGATION
ISSN journal
13502417 → ACNP
Volume
148
Issue
3
Year of publication
2001
Pages
153 - 156
Database
ISI
SICI code
1350-2417(200106)148:3<153:ANTLMA>2.0.ZU;2-R
Abstract
An accurate model for lossy non-uniform transmission lines is presented. Th e technique provides a coplanar waveguide (CPW) taper model, which has been used to accurately de-embed measurements of passive CPW components in line geometries differing from the nominal 50 Omega geometry of the calibration . The model accounts for both dielectric and conductor losses., and is show n to be in excellent agreement with measured results from 45 M Hz to 120 GH z.