Scaling-function based multiresolution time domain analysis for planar printed millimetre-wave integrated circuits

The paper applies a scaling-function based multiresolution time domain (MRT D) scheme, in conjunction with an anisotropic perfectly matched laver (APML ) for open and PEC-shielded boundary truncations, to analyse various planar millimetre-wave integrated circuits (MICs). Although adding complexity in deriving update equations and extracting MIC characteristics compared with the conventional finite difference time domain (FDTD) method, the MRTD sche me does provide a systematic, constructive, and flexible tool for the analy sis of practical planar printed MIC structures. In particular. it is shown that the MRTD scheme is very efficient and requires only about 15%. of the computational space and 25% or less of the time needed for the conventional FDTD techniques for all structures investigated in this research.