Deep-submicrometer DC-to-RF SOI MOSFET macro-model

Citation
B. Iniguez et al., Deep-submicrometer DC-to-RF SOI MOSFET macro-model, IEEE DEVICE, 48(9), 2001, pp. 1981-1988
Citations number
16
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
48
Issue
9
Year of publication
2001
Pages
1981 - 1988
Database
ISI
SICI code
0018-9383(200109)48:9<1981:DDSMM>2.0.ZU;2-R
Abstract
We present a submicrometer RF fully depleted SOI MOSFET macro-model based o n a complete extrinsic small-signal equivalent circuit and an improved CAD model for the intrinsic device. The delay propagation effects in the channe l are modeled by splitting the intrinsic transistor into a series of shorte r transistors, for each of which a quasistatic device model can be used. Si nce the intrinsic device model is charge-based, our RF SOI MOSFET model can be used in both small and large-signal analyses. The model has been valida ted for frequencies up to 40 GHz and effective channel lengths down to 0.16 mum.