A new detection system with polycapillary conic collimator for high-localized analysis of X-ray fluorescence emission

In this paper, we present a new detection system conceived for the X-ray fl uorescence (XRF) analysis of the radiation emitted by very small areas on t he sample. The system is based on the use of a polycapillary conic collimat or which captures the XRF emitted only from a local area of the sample inde pendently on how extended is the X-ray excitation. The use of a Peltier-coo led silicon drift detector allows to achieve high energy resolution with a very compact system configuration. In this first prototype, a spatial resol ution of about 150 mum has been verified in the analysis of thin metal stri ps. Moreover, the results of a first X-Y scanning for elemental mapping on a sample surface are also reported.