Noise in CdZnTe devices with different electrode configurations was investi
gated. Measurements on devices with guard-ring electrode structures showed
that surface leakage current does not produce any significant noise. The pa
rallel white noise component of the devices appeared to be generated by the
bulk current alone, even though the surface current was substantially high
er. This implies that reducing the surface leakage current of a CdZnTe dete
ctor may not necessarily result in a significant improvement in noise perfo
rmance. The noise generated by the bulk current is also observed to be belo
w full shot noise. This partial suppression of shot noise may be the result
of Coulomb interaction between carriers or carrier trapping. Devices with
coplanar strip electrodes were observed to produce a 1/f noise term at the
preamplifier output. Higher levels of this 1/f noise were observed with dec
reasing gap widths between electrodes. The level of this 1/f noise appeared
to be independent of bias voltage and leakage current but was substantiall
y reduced after certain surface treatments.