Simultaneous determination of the concentration of elements and their speciation in solid samples using X-ray fluorescence spectrometry

A method is proposed for the X-ray emission analysis of solid samples in wh ich two analytical signals are used in one experiment. The first signal dep ends on the structure and type of the chemical compound in the test sample, and the second one is used for determining the concentration of elements e ntering into the composition of the test sample. The relative integral inte nsity of the last emission line in the characteristic X-ray spectrum is use d as the first analytical signal. This line is due to an electron transitio n from the valence band to an inner atomic level (for example, the K-beta2 line for elements from Cu to Br). The spectral intensity of the brightest ( K-alpha, L-alpha, and, less frequently, M-alpha or M-beta) lines of the cha racteristic X-ray spectrum serves as the second analytical signal, which is conventionally used in X-ray fluorescence analysis.