V. Ryzhii et al., Steady-state characteristics of lateral p-n junction vertical-cavity surface-emitting lasers, J APPL PHYS, 90(6), 2001, pp. 2654-2659
We developed an analytical device model for lateral p-n junction vertical-c
avity surface-emitting lasers (LJVCSELs) with a quantum well active region.
The model takes into account the features of the carrier injection, transp
ort, and recombination in LJVCSELs as well as the features of the photon pr
opagation in the cavity. This model is used for the calculation and analysi
s of the LJVCSEL steady-state characteristics. It is shown that the localiz
ation of the injected electrons primarily near the p-n junction and the rea
bsorption of lateral propagating photons significantly effects the LJVCSELs
performance, in particular, the LJVCSEL threshold current and power-curren
t characteristics. The reincarnation of electrons and holes due to the reab
sorption of lateral propagating photons can substantially decrease the thre
shold current. (C) 2001 American Institute of Physics.