Single-electron transistor with metallic microstrips instead of tunnel junctions

Citation
Va. Krupenin et al., Single-electron transistor with metallic microstrips instead of tunnel junctions, J APPL PHYS, 90(5), 2001, pp. 2411-2415
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
90
Issue
5
Year of publication
2001
Pages
2411 - 2415
Database
ISI
SICI code
0021-8979(20010901)90:5<2411:STWMMI>2.0.ZU;2-D
Abstract
A single-electron transistor (SET) comprising highly resistive Cr thin-film strips (sheet resistance similar to4 k Omega) instead of traditional tunne l barriers is reported. Two such strips (similar to1 mum long) connect two Al outer electrodes to an Al island 1 mum in length equipped with a capacit ively coupled gate. This transistor with a total asymptotic resistance of 1 10 k Omega showed a perfect Coulomb blockade and strictly e-periodic reprod ucible modulation by the gate in wide ranges of bias (V) and gate (V-g) vol tages. In the Coulomb-blockade region (\V\less than or equal to about 0.5 m V), we observed a strong suppression of the transport current, allowing mod ulation curves V(V-g) with appreciable amplitude to be measured at a fixed bias current value I as low as 100 fA. The background-charge noise of our S ET was found to be similar to that of typical Al/AlOx/Al tunnel-junction si ngle-electron transistors, namely deltaQ approximate to 5x10(-4)e/root Hz a t 10 Hz. The electron transport mechanism is discussed. (C) 2001 American I nstitute of Physics.