R. Loo et al., Structural and optical properties of Ge islands grown in an industrial chemical vapor deposition reactor, J APPL PHYS, 90(5), 2001, pp. 2565-2574
The use of Si based materials for optoelectronic applications is hampered b
y the indirect nature of the band gap. One possible solution by which to im
prove the radiative light emission is three-dimensional Stranski-Krastanow
growth of Si1-xGex or pure Ge on top of Si. In this article we give a detai
led overview about the growth kinetics observed for Ge growth in a standard
production oriented chemical vapor deposition system. With increasing depo
sition time, we observed the usual changeover from monomodal to bimodal isl
and distribution. The island morphology and density can be controlled by va
rying the growth conditions or by applying a thermal anneal after island gr
owth. Island densities up to 2.3x10(10) cm(-2) have been obtained for depos
itions at 650 degreesC. A Si cap layer is needed for photoluminescence meas
urements as well as for some device structures. However, Si capping at 700
degreesC leads to nearly total dissolution of small islands and truncation
of bigger dome-shaped islands. This can be prevented by reducing the deposi
tion temperature and by changing the Si gas source. Photoluminescence measu
rements demonstrate the high layer quality of Si capped islands by the clea
r separation between the no-phonon line and the transversal optical (TO) re
plica and the high peak intensities. The spectral range of the island lumin
escence is between 1.35 (920 meV) and 1.50 mum (828 meV) and depends on the
growth conditions. At 20 K, we found up to 70 times higher values for the
integrated no-phonon and the TO luminescence from the islands, compared to
the integrated intensity from the Si TO peak. Nevertheless, the high photol
uminescence intensity can be further enhanced by a thermal treatment in a H
-2 plasma. Clear island luminescence up to 200 K has been observed after su
ch thermal treatment, which shows the potential of this material system for
optoelectronic device applications. (C) 2001 American Institute of Physics
.