Nh. Cho et Cb. Carter, Formation, faceting, and interaction behaviors of antiphase boundaries in GaAs thin films, J MATER SCI, 36(17), 2001, pp. 4209-4222
Antiphase boundaries occur in GaAs epilayers grown on (001) Ge substrates b
y organometallic vapor-phase epitaxy methods. The formation and structural
characteristics of these boundaries were investigated by transmission elect
ron microscopy (TEM). Steps with particular heights at the surface of subst
rates nucleate antiphase boundaries. The observed faceting behavior of thes
e boundaries indicates that energy associated with the presence of antiphas
e boundaries is strongly related with the boundary planes, and preservation
of the stoichiometry of GaAs appears to play an important role in achievin
g a lower energy state at antiphase boundaries. (C) 2001 Kluwer Academic Pu
blishers.