Dielectric suppression and its effect on photoabsorption of nanometric semiconductors

Citation
Cq. Sun et al., Dielectric suppression and its effect on photoabsorption of nanometric semiconductors, J PHYS D, 34(15), 2001, pp. 2359-2362
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS D-APPLIED PHYSICS
ISSN journal
00223727 → ACNP
Volume
34
Issue
15
Year of publication
2001
Pages
2359 - 2362
Database
ISI
SICI code
0022-3727(20010807)34:15<2359:DSAIEO>2.0.ZU;2-0
Abstract
Deeper insight is presented into the origin of the dielectric suppression a nd its effect on the photoabsorption of nanometric semiconductors. Consiste ncy between modelling predictions and experimental observations reveals tha t the dielectric suppression originates from the enhancement of the crystal field due to surface bond contraction and the rise of the surface-to-volum e ratio with decreasing particle size. The suppression of the dielectric fu nction will lead to a blue shift in photoabsorption edges, which may find a pplication in microelectronic and photonic devices of nanometre scales.