Calculations are presented for the femtosecond time-evolution of intensitie
s of beams diffracted by perfect Bragg crystals illuminated with radiation
expected from X-ray free-electron lasers (XFELs) operating through the self
-amplified spontaneous emission (SASE) process. After examining the case of
transient diffraction of an electromagnetic delta-function impulse through
flat, single- and double-crystal monochromators, the propagation of a 280
fs-duration SASE XFEL pulse of 8 keV photons through the same optics is dis
cussed. The alteration of the sub-femtosecond spiky microbunched temporal s
tructure of the XFEL pulse after it passes through the system is shown for
both low-order (broad bandwidth) and high-order (narrow bandwidth) crystal
reflections. Finally, the shot-to-shot statistical fluctuations of the inte
grated diffracted intensity is simulated. Implications of these results for
XFEL applications are addressed.