Hc. Cheng et al., A study of factors affecting solder joint fatigue life of thermally enhanced ball grid array assemblies, J CHIN I EN, 24(4), 2001, pp. 439-451
In this study, a finite element study of design factors, including material
constants and geometry parameters, affecting fatigue life of solder joints
of atypical cavity-down Thermally Enhanced Ball Grid Array (TEBGA) assembl
y subjected to an accelerated temperature cycling load is performed. In ord
er to precisely characterize the fatigue life of solder joints, the geometr
y profile of solder joints within the package is substantially predicted us
ing an energy-based method-the Surface Evolver (see, e.g., Brakke, 1994; Ch
iang et al., 2000). In addition, a finite-volume-weighted averaging techniq
ue is proposed to describe the strain/stress response of solder joints at m
aterial/geometry discontinuities. The analysis employs a plane strain FE mo
del with the purpose of reducing the computational cost. To validate the FE
modeling so as to corroborate the nonlinear and complex mechanical behavio
rs of materials in the assembly, a typical interferometric displacement mea
surement method-- Moire interferometry (see, Han and Guo, 1995) and 3-D sol
id modeling are used. Through the parametric design of the fatigue life of
solder joints, the reliability characteristics of the TEBGA assembly are th
en effectively identified.