Hp. Hsueh et al., Ion energy distributions and optical emission spectra in NF3-based processchamber cleaning plasmas, J VAC SCI B, 19(4), 2001, pp. 1346-1357
To minimize ion bombardment induced damage in NF3-based chamber cleaning pl
asmas, we have studied the effects of diluent gases and reactor pressure on
ion energy distribution functions in NF3 plasmas. We have utilized plasma
ion mass spectrometry, ion energy analysis, and optical emission spectrosco
py in 25 mol % NF3 plasmas with argon, helium, and oxygen diluents. We have
also compared the NF3-based plasma measurements to those of 50 mol % C2F6/
O-2 plasmas. We have demonstrated that diluting with helium and operating a
t higher pressures will reduce ion energies in NF3 plasmas while maintainin
g superior chamber cleaning performance. In addition, we have correlated th
e intensity ratio of specific argon emission lines to average ion energies
at the grounded electrode. This correlation provides a practical diagnostic
s tool for further optimization work. (C) 2001 American Vacuum Society.