Silicon on GaN(0001) and (000(1)over-bar) surfaces

Citation
Cd. Lee et al., Silicon on GaN(0001) and (000(1)over-bar) surfaces, J VAC SCI B, 19(4), 2001, pp. 1619-1625
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
19
Issue
4
Year of publication
2001
Pages
1619 - 1625
Database
ISI
SICI code
1071-1023(200107/08)19:4<1619:SOGA(S>2.0.ZU;2-D
Abstract
Surface reconstructions and adatom kinetics of silicon on GaN(0001) and (00 01) surfaces are studied by scanning tunneling microscopy, electron diffrac tion, and first-principles calculations. For silicon coverage near 0.5 mono layer, a 2 X 2 structure is observed, and is interpreted in terms of a mode l consisting of a Ga adatom on a monolayer of 3 Ga+ 1Si and a Si-Ga atom in the third layer. For higher silicon coverage, disordered 2 X 2 domains and "1 X 1" domains are found to coexist. After annealing above 300 degreesC t he "1 X 1" regions become dominant and a 4 X 4 structure is seen near step edges. It is concluded that the silicon adatoms tend to reside in subsurfac e sites on the Ga-polar surface. Surface morphology in the presence of Si i s smooth for the (0001) surface but rough for the (0001) surface. This diff erence is attributed to the presence of multiple Ga surface layers in the f ormer case, which enhance surface diffusivities. (C) 2001 American Vacuum S ociety.