Optical anisotropy of organic layers on GaAs(001)

Citation
Am. Paraian et al., Optical anisotropy of organic layers on GaAs(001), J VAC SCI B, 19(4), 2001, pp. 1658-1661
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
19
Issue
4
Year of publication
2001
Pages
1658 - 1661
Database
ISI
SICI code
1071-1023(200107/08)19:4<1658:OAOOLO>2.0.ZU;2-P
Abstract
The application of the linear-optical, polarization sensitive methods, in s itu reflectance anisotropy spectroscopy (RAS), and ex situ spectroscopic el lipsometry, for the characterization of organic layers is discussed and the results of the investigation of 3,4,9,10-perylenetetracarboxylic dianhydri de (PTCDA) layers on sulfur passivated GaAs(001) surfaces are presented. Th e organic layers were grown via organic molecular beam deposition at room t emperature. The RA spectrum of the sulfur terminated GaAs surface shows a d erivative like feature at E-1 gap and a feature in the higher energy range related to E-2 of bulk GaAs. Upon the PTCDA deposition, additional features appear in the spectra which can be attributed to PTCDA while the GaAs feat ure near El remains unchanged indicating that the surface reconstruction st ays intact. The imaginary part of the pseudo-dielectric function is found t o be angular dependent. This dependence also changes as a function of azimu thal angle. While the first can be well described using existing models for optical uniaxial layers, the latter is likely to be related to in-plane op tical anisotropy. (C) 2001 American Vacuum Society.