In-process gage frequency response measurement

Citation
Dm. Longanbach et Tr. Kurfess, In-process gage frequency response measurement, MECHATRONIC, 11(6), 2001, pp. 745-757
Citations number
10
Categorie Soggetti
AI Robotics and Automatic Control
Journal title
MECHATRONICS
ISSN journal
09574158 → ACNP
Volume
11
Issue
6
Year of publication
2001
Pages
745 - 757
Database
ISI
SICI code
0957-4158(200109)11:6<745:IGFRM>2.0.ZU;2-4
Abstract
This paper describes a method for determining the frequency response charac teristics of in-process measurement systems. Determination of the frequency response extends the usefulness of such mechanical systems by allowing pro per detection and interpretation of out-of-roundness information on the sur face of a workpiece. The excitation and analysis methodology using establis hed signal processing techniques is presented in detail with appropriate re ferences. The experimental setup is discussed in detail including a brief i ntroduction to the piezoelectric system used for excitation and the signal processing hardware and software used for analysis. Results are shown for b oth internal and external LVDT based in-process gages used primarily by man ufacturers to improve the precision of the internal and external grinding p rocess. The discussion includes analysis of both the frequency domain and w ith respect to the maximum number of undulations per revolution that the ga ge is expected to detect. The work presented introduces a commercially avai lable technique that can be adopted by industry for the purpose of gatherin g additional information from existing in-process measurement systems durin g a process. (C) 2001 Elsevier Science Ltd. All rights reserved.