Investigation of the performance of the resistive voltage source used for the FDTD analysis of microstrip circuits

Citation
Ap. Zhao et P. Alinikula, Investigation of the performance of the resistive voltage source used for the FDTD analysis of microstrip circuits, MICROW OPT, 30(6), 2001, pp. 378-381
Citations number
8
Categorie Soggetti
Optics & Acoustics
Journal title
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
ISSN journal
08952477 → ACNP
Volume
30
Issue
6
Year of publication
2001
Pages
378 - 381
Database
ISI
SICI code
0895-2477(20010920)30:6<378:IOTPOT>2.0.ZU;2-0
Abstract
In this paper, the performance of the resistive voltage source (RVS) model used for the FDTD analysis of microstrip circuits is evaluated. It is found that, when the actual physical impedance of a microstrip line is used for assigning a constant value of R-s into the corresponding electric nodes in the RVS region, the model often induces quite large reflections. Detailed n umerical investigations indicate that the performance of the RVS model can he greatly enhanced when the effective impedance (which is determined by ex amining the maximum value of the calculated voltage between the strip line and the ground plane). instead of the physical impedance, of the microstrip line is used for the RVS model. (C) 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 378-381, 2001.