The geometries, formation energies, and diffusion barriers of carbon point
defects in silica (a-quartz) have been calculated using a charge-self-consi
stent density-functional based nonorthogonal tight-binding method. It is fo
und that bonded interstitial carbon configurations have significantly lower
formation energies (on the order of 5 eV) than substitutionals. The activa
tion energy of atomic C diffusion via trapping and detrapping in interstiti
al positions is about 2.7 eV. Extraction of a CO molecule requires an activ
ation energy <3.1 eV but the CO molecule can diffuse with an activation ene
rgy <0.4 eV. Retrapping in oxygen vacancies is hindered-unlike for O-2-by a
barrier of about 2 eV.