Substrate-mediated multiwave resonance grazing incidence x-ray diffractionin thin films: A method for direct phase determination - art. no. 085406

Direct phase determination of surface in-plane reflection is realized for t hin films on substrates by using substrate reflections as an intermediary t o enhance the coherent interaction in resonant multiwave grazing incidence diffraction in thin films. The coupling of the in-plane diffracted waves at the interface between the thin film and the substrate is essential, The in tensity variation due to this enhanced interaction/coupling becomes clearly visible, thus leading to unambiguous phase determination. This opens a dif ferent way for direct phase determination of surface reflections in thin fi lms.