Matrix characterization using synchrotron radiation X-ray diffraction

X-ray spectrometry is a non-destructive and multi-elemental technique widel y used for elemental analysis. This technique has inherent complexities for quantitative analysis because of matrix effects. Matrix absorption is the most important determining factor when accurate measurements are required f or thick samples. Therefore, new methods have to be developed in order to e valuate matrix effects. In this work, the feasibility of using the synchrot ron X-ray diffraction for matrix characterization has been investigated. Al l measurements were performed at the Laboratorio Nacional de Luz Sincrotron (LNLS), in Campinas, Brazil. Diffraction patterns for boric acid and cellu lose matrix containing different oxides were recorded. The preliminary resu lts encourage us to examine further the application of Xray diffraction ana lysis combined with energy-dispersive X-ray fluorescence analysis for chara cterization of thick samples. (C) 2001 Elsevier Science Ltd. All rights res erved.