DIFFRACTION INVESTIGATIONS OF THE RADIATION STRENGTH OF VANADIUM DIOXIDE INTERFERENCE STRUCTURES

Authors
SHADRIN EI CHUDNOVSKII FA TSIBADZE KS KHAKHAEV IA
Citation
Ei. Shadrin et al., DIFFRACTION INVESTIGATIONS OF THE RADIATION STRENGTH OF VANADIUM DIOXIDE INTERFERENCE STRUCTURES, Technical physics, 42(4), 1997, pp. 403-405
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
Technical physics → ACNP
ISSN journal
10637842
Volume
42
Issue
4
Year of publication
1997
Pages
403 - 405
Database
ISI
SICI code
1063-7842(1997)42:4<403:DIOTRS>2.0.ZU;2-4
Abstract
Optical breakdown of vanadium oxide film interferometers is investigat ed by the method of recording irreversible diffraction gratings, and t he optical damage threshold of the gratings is measured and found to b e 76+/-4 mJ/cm(2). (C) 1997 American Institute of Physics.