The advancements made in molecular technology coupled with statistical meth
odology have led to the successful detection and location of genomic region
s (quantitative trait loci; QTL) associated with quantitative traits. Binar
y traits (e.g. susceptibility/resistance), while not quantitative in nature
, are equally important for the purpose of detecting and locating significa
nt associations with genomic regions. Existing interval regression methods
used in binary trait analysis are adapted from quantitative trait analysis
and the tests for regression coefficients are tests of effect, not detectio
n. Additionally, estimates of recombination that fail to take into account
varying penetrance perform poorly when penetrance is incomplete. In this wo
rk a complete probability model for binary trait data is developed allowing
for unbiased estimation of both penetrance and recombination between a gen
etic marker locus and a binary trait locus for backcross and F-2 experiment
al designs. The regression model is reparameterized. allowing for tests of
detection. Extensive simulations were conducted to assess the performance o
f estimation and testing in the proposed parameterization. The proposed par
ameterization was compared with interval regression via simulation. The res
ults indicate that our parameterization shows equivalent estimation capabil
ities, requires less computational effort and works well with only a single
marker.