Concurrent test for digital linear systems

Invariant-based concurrent test schemes can provide economical solutions to the problem of concurrent error detection. An invariant-based concurrent e rror-detection scheme for linear digital systems is proposed. The cost of c oncurrent error-detection hardware is appreciably reduced due to utilizatio n of a time-extended invariant, which extends the error-checking computatio n over time and, thus, reduces hardware requirements. Error-detection capab ilities of the scheme proposed in this work are analyzed and conditions on the implementation for achieving complete fault coverage are outlined. Impl ementations fulfilling such conditions have been shown through experiments to provide 100% concurrent fault detection.