Interconnect sizing and spacing with consideration of coupling capacitance

Citation
J. Cong et al., Interconnect sizing and spacing with consideration of coupling capacitance, IEEE COMP A, 20(9), 2001, pp. 1164-1169
Citations number
23
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
ISSN journal
02780070 → ACNP
Volume
20
Issue
9
Year of publication
2001
Pages
1164 - 1169
Database
ISI
SICI code
0278-0070(200109)20:9<1164:ISASWC>2.0.ZU;2-N
Abstract
This paper studies interconnect sizing and spacing (ISS) problem with consi deration of coupling capacitance for performance optimization of single or multiple critical nets. We introduce the formulation of symmetric and asymm etric wire sizing. We develop efficient bound computation algorithms for IS S optimization and prove their optimality under general interconnect resist ance and capacitance models. Our experiments show that our algorithms are v ery effective and obtain significant performance improvement compared to pr evious wire-sizing/spacing algorithms.