Forward and inverse parameter estimation algorithms of interdigital dielectrometry sensors

In this paper we extend the continuum model for interdigital dielectrometry sensors and propose a new, direct technique for estimating material electr ical properties from measurements. Interdigital sensors consist of alternat ing pairs of long, thin electrodes on a plane. An ideal model assumes that the periodic structure extends to infinity and the electrodes have no thick ness. We extend this ideal analysis to account for the physical thickness o f the electrodes. We also present the model in a matrix form which is amena ble to linear algebraic analysis techniques. In particular, the 'inverse pr oblem' of estimating material properties is formulated as a generalized Eig envalue problem, which avoids the convergence problems of previous iterativ e algorithms.