The sol-gel method was used to prepare PbTiO3 (PT) and PbTiO3-Al2O3 (PT-AL)
thin films on amorphous (SiO2 glass) and crystalline (111) Si, and (0001)
Al2O3) substrates using the dip-coating technique. The films were examined
by XRD methods to describe the phase composition, cell parameters and degre
e of texture, by electron microprobe, AFM, SEM, EDAX and Rutherford backsca
ttering to evaluate the microstructure and composition. PT-AL films are str
essed, have grain size smaller than 0.1 mum and modified cell parameters of
PT phase (lower cla tetragonality). In dependence on the molar ratio of Ti
:Al, the different extent of crystallographic ordering was observed ranging
from randomly oriented to strongly textured crystallites of PT. In the com
positional range of Ti/Al 2 divided by4 the films show strong fibre texture
with the a-axis (axis of texture) oriented perpendicular to the film plane
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