Data averaging effect on roughness measurement using phase-shifting interferometry for a few-ten-angstrom and sub-angstrom rough surfaces

Authors
Citation
Ms. Jo et Ms. Oh, Data averaging effect on roughness measurement using phase-shifting interferometry for a few-ten-angstrom and sub-angstrom rough surfaces, JPN J A P 1, 40(7), 2001, pp. 4736-4740
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
7
Year of publication
2001
Pages
4736 - 4740
Database
ISI
SICI code
Abstract
The phase and intensity data averaging effect on roughness measurement usin g phase-shifting interferometry was investigated for a few-ten-A and sub-A rough surfaces. For a few-ten-A rough surface, the roughness value did not depend on the data average. In contrast, the sub-A rough surface determinat ion was strongly influenced by the data average so that measurement error w as significantly improved as the number of data averages increased. As an o ptimal data average condition that die measurement noise was minimized, 30 phase data and 20 intensity data averages were experimentally determined. S ub-A roughness measurement under the optimal data average condition had hig h measurement accuracy of the absolute roughness and small measurement repr oducibility error.