Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy

The higher order nonlinear dielectric imaging technique using scanning nonl inear dielectric microscopy (SNDM) is investigated. The resolution of the h igher order nonlinear dielectric imaging is much higher than that of the co nventional nonlinear dielectric imaging which detects the lowest order of t he nonlinear dielectric constant. It is demonstrated that this higher order imaging is very useful for observing a surface layer with a unit cell scal e thickness formed on ferroelectric material.