Molecular ferroelectricity of vinylidene fluoride oligomer investigated byatomic force microscopy

Citation
K. Noda et al., Molecular ferroelectricity of vinylidene fluoride oligomer investigated byatomic force microscopy, JPN J A P 1, 40(6B), 2001, pp. 4361-4364
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
6B
Year of publication
2001
Pages
4361 - 4364
Database
ISI
SICI code
Abstract
Nanometer-scale electrical properties of local ferroelectric domains formed in thin films of newly synthesized vinylidene fluoride (VDF) oligomer were investigated by atomic force microscopy (AFM). Local poling and observatio n of the piezoelectric response revealed that the polarized domains were re versibly formed and erased in a nanometer-thick film by applying dc or puls e voltages between the electrically conductive AFM tip and the bottom elect rode. The formed domain size depends on the pulse poling conditions and inc reases when the magnitude and the duration of a pulse voltage are increased . A local domain with a diameter of 65 nm was successfully created. The res ults in this work are comparable to those of previous studies performed on ferroelectric polymer thin films, suggesting that this material is one of t he promising candidates for ferroelectric applications such as high-density data storages, and for molecular controls of ferroelectric properties.