Improvement in image reconstruction of scanning near-field millimeter-wavemicroscopy using a metal slit-type probe

Improvements in image reconstruction of scanning near-field millimeter-wave microscopy using a metal slit-type probe have been demonstrated. A conjuga te gradient method in combination with preconditioning and regularization h as been used during the image reconstruction process to take into account t he sensitivity distribution of the slit-type probe. The reconstructed image s show that the image degradation that occurs due to the sensitivity distri bution can be corrected.