Photoacoustic spectra for porous silicon using piezoelectric transducer and microphone

Citation
T. Kawahara et al., Photoacoustic spectra for porous silicon using piezoelectric transducer and microphone, JPN J A P 1, 40(5B), 2001, pp. 3610-3613
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
5B
Year of publication
2001
Pages
3610 - 3613
Database
ISI
SICI code
Abstract
Photoacoustic (PA) spectra are measured for porous Si (PS) using piezoelect ric detectors (PPT) and compared with the microphone PA (MPA) spectra to ex amine the nonradiative properties of PS that has complicated nanostructures . Three peaks (peaks 1 and 2, and a small peak at 600 nm) are observed in s amples 2 and 3 with porosities p = 60 and 70%, respectively, while only a s ingle peak (peak 1) is observed in sample 1 with p = 30%. Peak 2 is related to the band gap of the Si substrate. In Contrast. peak 1 seems to be due t o the absorption change at the band gap unique to the PS. This band gap shi fts to higher energy for PS samples with higher porosity. We propose that t his band gap is defined by the largest size nanocrystals. where PS has nano crystallite size distribution. The small peak at 600 nm is related to the P L peak and it is observed only in PPT spectra. These results suggest that d ifferent mechanisms are operating in PPT spectra and NIPA ones for the enha ncement of the PA spectra.