H. Okada et H. Hasegawa, Novel single electron memory device using metal nano-dots and Schottky in-plane gate quantum wire transistors, JPN J A P 1, 40(4B), 2001, pp. 2797-2800
We report on the successful realization of a novel single electron memory d
evice utilizing a Schottky in-plane gate (IPG) quantum wire transistor (QWT
r) with nano Schottky metal dots whose position and size can be precisely c
ontrolled. Current-voltage (I-V) characteristics of the nano-metal dot form
ed on n-GaAs showed clear hysteresis which suggests charging of the nano-me
tal dot. A fabricated single electron memory device utilizing nano-metal do
ts showed clear threshold voltage shift once the bias was applied to the ch
arging control gate of the nano-metal dot. This indicates successful memory
operation of the fabricated device.