A new laser lithography technique using the effect of optical superresoluti
on can effectively reduce the exposed spot size on a photoresist layer, thu
s allowing disk mastering toward higher density using an existing light sou
rce and optics. A thin metallic mask layer deposited on the top of the phot
oresist layer is used to obtain a "below optical diffraction limit" linewid
th on the photoresist layer. The feasibility of the laser lithography techn
ique, as evaluated by simulation and experimental results, revealed that th
e linewidth on the photoresist layer could be shrunk by more than 50% of th
e diffraction limit of the optical system.