The resistivity rho of CuIr2S4 and CuIr2Se4 have been measured at temperatu
res from 2 to 300 K under hydrostatic pressures up to 2 GPa. The conductivi
ty a at low temperature in the insulating phase of CuIr2S4 is expressed as
follows: sigma = exp[ - (T-i*/T)(0.5)]. The pressure dependence of the acti
vation energy and metal-insulator transition temperature give evidence that
Coulomb correlations are important. Appearance of the insulating phase in
CuIr2Se4 is at a lower pressure than it had been assumed. The total resisti
vity under pressure can be represented as the resistivity in two parallel c
hannels: the metallic resistivity which is exponentially dependent on tempe
rature and the semiconducting one. The effective cross-section of the semic
onducting channel rapidly increases with pressure above 1 GPa. (C) 2001 Els
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