Co/Cu spin-valve structures have been electrodeposited from a single bath d
irectly onto n-type (1 0 0) Si substrates. The structures were based on the
fact that Co layers on Si show a dependence of coercive field on layer thi
ckness. By sandwiching a stack of 3, 5 or 8 hard antiferromagnetic-coupled
Co/Cu multilayers between two soft Co layers, it was possible to obtain low
-field-sensitive magnetoresistive structures. showing MR ratios ranging fro
m 5.9% to 8.6%. as well as field sensitivities in the range of 0.10% Oe at
15-40 Oe. Samples with 8.6% MR ratio were obtained by stacking up to 10 mag
netic layers. (C) 2001 Elsevier Science B.V. All rights reserved.