Electrical characterization of single-walled carbon nanotubes with Scanning Force Microscopy

In this work, a study of the possibilities of the Scanning Force Microscope (SFM) for studying transport properties of carbon nanotubes (CNTs) was don e. Single-walled carbon nanotubes were deposited on SiO2. Afterwards, using a mask, the surface was covered with gold, so that some of the carbon nano tubes in the surface stick out underneath the gold. In those areas, topogra phies and electrical measurements with metallic cantilevers have been carri ed out. We have developed simultaneous force vs. distance and current vs. d istance data along the uncovered length of the nanotubes. In addition, curr ent vs. voltage data was acquired at the maximum loading force during the i ndentation process. We found that the current rises abruptly when the tip t ouches the carbon nanotube and it is compared with similar experiments on t he gold surface by the carbon nanotube. (C) 2001 Elsevier Science B.V. All rights reserved.