Zirconium titanate-based thin films are considered as a promising dielectri
c material for the next generation of integrated microwave devices. The zir
conium tin titanate (ZTS) precursor was prepared via a polymeric precursor
process in aqueous phase. based on the citrate route. The presented chemica
l procedure is original for this kind of materials. C-13 nuclear magnetic r
esonance (NMR) spectra showed that stable mixed-metal chelate complex has b
een formed. The viscous resin was multiple spin-coated with intermediate fi
rings at 300 degreesC onto platinized Si substrates and fired in air at 700
degreesC. Thin films 200-nm thick were obtained. Atomic force microscope (
AFM) analysis showed that the coverage is homogeneous, the surface texture
consisting of elongated grains of average size 20 X 36 nm. Grazing incidenc
e X-ray diffraction analysis (GIXRD) indicated that only the zirconium tin
titanate phase is present within the examined range of penetration depth. (
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