Atom-probe investigations of fine-scale features in intermetallics

Citation
A. Menand et al., Atom-probe investigations of fine-scale features in intermetallics, MICRON, 32(8), 2001, pp. 721-729
Citations number
47
Categorie Soggetti
Multidisciplinary
Journal title
MICRON
ISSN journal
09684328 → ACNP
Volume
32
Issue
8
Year of publication
2001
Pages
721 - 729
Database
ISI
SICI code
0968-4328(200112)32:8<721:AIOFFI>2.0.ZU;2-S
Abstract
Intermetallics have been studied by means of Atom Probe Field Ion Microscop y. Atom-Probe techniques have been used to determine the phase composition and to study the role and the influence of additional elements. The use of the Tomographic Atom Probe makes it possible to map out the distribution of chemical species in a small volume of the material at a near atomic scale. This has been particularly used in order to study segregation of additiona l elements at interfaces or planar and linear defects in TiAl base and FeAl base alloys. (C) 2001 Elsevier Science Ltd. All rights reserved.